Apr 16, 2024  
2022-2023 Undergraduate Catalog 
    
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CpE 408 - VLSI Physical Design and Testing



VLSI CAD algorithms for partitioning, floor planning, placement, routing, layout, and compaction. Test process and equipment, fault modeling and simulation, defects, Automatic Test Pattern Generation (ATPG), built-in self-test, design for testability. This course is crosslisted with ECG 608. Credit at the 600-level requires additional work.

Credits: 3
Prerequisites:    and EE 320 .  All prerequisites must be completed with a grade of C or better.  Advanced Standing required.