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Mar 10, 2026
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2017-2018 Undergraduate Catalog ARCHIVED CATALOG: CONTENT MAY NOT BE CURRENT. USE THE DROP DOWN ABOVE TO ACCESS THE CURRENT CATALOG.
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CpE 408 - VLSI Physical Design and Testing
VLSI CAD algorithms for partitioning, floor planning, placement, routing, layout, and compaction. Test process and equipment, fault modeling and simulation, defects, Automatic Test Pattern Generation (ATPG), built-in self-test, design for testability.
Credits 3
Prerequisites and EE 320 . All prerequisites must be completed with a grade of C or better. Advanced Standing required.
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